Home
Contact
Mission
Products
Service
Publications
Presentation
Forum
Gallery
Highlights
Privacy Policy

 

Electrical Characterization of semi-insulating Compound Semiconductor Substrates

 

If you are interested in material characterizations performed by SemiMap systems COREMA - WT, COREMA - RM, COREMA - ER and COREMA - VT, you may want to have your products evaluated by these methods. We shall perform respective test measurements rapidly and confidentially in our test laboratory.

After having ordered a system, you may be interested in wafer characterization until your equipment is delivered and installed. Again we shall be prepared to meet such demand.

Finally, while the decision to purchase a system must be kept open for budgetary or other reasons, you may nevertheless want to receive respective wafer characterizations as a measurement service. We shall offer and render such service, subject to capacity limitations.

Characterization supplied (for sample requirements and measurement ranges, see product specifications):

bullet

Resistivity mapping of GaAs, SiC, InP, GaN, CdTe

bullet

Mobility measurement of GaAs, InP

bullet

Temperature dependent resistivity measurements of SiC, GaN, CdTe

Please contact info@semimap.de

 
IF you have questions or comments, please send your E-mail to: info@semimap.de 
Last modification: 24/06/19