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Electrical Characterization of semi-insulating Compound Semiconductor Substrates
If you are interested in material characterizations performed by SemiMap systems COREMA - WT, COREMA - RM, COREMA - ER and COREMA - VT, you may want to have your products evaluated by these methods. We shall perform respective test measurements rapidly and confidentially in our test laboratory. After having ordered a system, you may be interested in wafer characterization until your equipment is delivered and installed. Again we shall be prepared to meet such demand. Finally, while the decision to purchase a system must be kept open for budgetary or other reasons, you may nevertheless want to receive respective wafer characterizations as a measurement service. We shall offer and render such service, subject to capacity limitations. Characterization supplied (for sample requirements and measurement ranges, see product specifications):
Please contact info@semimap.de |
IF you have questions or comments, please send your E-mail to:
info@semimap.de
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